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6%±0.5%, 20E), which is not recommended. Electron SS deviation uncertainties (k=1), otherwise, varied from 0.2% overall to 0.1% with large apertures. Photon uncertainties varied from 1.1% overall to 0.2% non-superficially with large apertures. The simplified straight-step method exhibited overall greater deviation from SS, most notably -2.8%±0.1% (6E) and -2.5%±0.4% (20E) superficially with 90°±45°, and -1.4%±0.3% (6X) and -0.6%±0.2% (15X) non-superficially with 90°±5° for ESTEPE∈[0.10,0.25]. We demonstrate step-size ind
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