https://www.selleckchem.com/pr....oducts/iacs-010759-i
The results show that angle measurement output accuracy can be guaranteed when the number of lines covered by the stains is less than half of the coding-bits. This work may provide a technical basis for enhancing stain resistance in high-performance displacement measurement technology.In this paper, modeling for a lateral impact ionization InGaAs/InP avalanche photodiode (APD) has been performed based on a device simulator, i.e., Silvaco ATLAS. Compared with traditional APDs, the lateral impact ionized APD has much higher
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