https://www.selleckchem.com/products/roc-325.html
In this paper, the defects of TiO2/Ag2O nanoheterojunctions are regulated to evaluate the effect of the interface defects on carrier trapping and recombination dynamics by time-resolved photoluminescence spectroscopy (TRPL) and time-resolved terahertz (THZ) spectroscopy. TRPL spectra reveal that interface defects can act as a recombination center and have an accelerative effect on the recombination process of photogenerated carriers under ultraviolet light. Moreover, THZ spectroscopy results demonstrate that interface defects can effect


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