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Organic thin film materials with molecular ordering are gaining attention as they exhibit semiconductor characteristics. When using them for electronics, the thermal management becomes important, where heat dissipation is directional owing to the anisotropic thermal conductivity arising from the molecular ordering. However, it is difficult to evaluate the anisotropy by simultaneously measuring in-plane and cross-plane thermal conductivities of the film on a substrate because the film is typically as thin as tens to hundreds of nanometer